Project

Characterization of defects in chromium layers

We use FIB-SEM, X-rays and surface energy to characterize defects in chromium layers and look for the causes of defects in chromium layers due to changes in the chemicals in their production process.

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Objective: To understand the causes of the change in functionality

Our client had detected changes in the surface properties of its product after changing the supplier of several of the chemicals used in its production process. Its product, a very special high-end piece, is composed of several very thin metallic layers with chromium. The objective is to find out the causes of the change in functionality in order to correct this problem.

Solution. We use FIB-SEM, X-ray, contact angle and surface energy to characterize the differences of the chromium layers.

The first step was to understand the differences between the samples with the appropriate properties and the samples in which the change in functionality had been detected. A work methodology was defined in agreement with the client, in order to know at all times what information would be most useful.

The second step was the selection and definition of the tests. In this specific case, since there were several layers, a morphological and composition analysis was carried out on a cross section of the sample using FIB-SEM. The section was made with the ion gun of the microscope itself so as not to damage or modify the layers. We completed the study with an analysis using X-rays.

Characterization of defects

The next step was to carry out the functional tests, in this case contact angle and surface energy to compare samples.

With all the data collected, we carried out the study, analysis and interpretation of the results. This is one of the parts we enjoy the most, and where we contribute the most to the projects.

Here we discovered the origins of the failure, since one of the new chemical products incorporated gave rise to a by-product that was the cause of the problem. An alternative was proposed, as well as some improvements in the process.

 

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